物探化探计算技术Issue(5)：547-554,8.DOI:10.3969/j.issn.1001-1749.2014.05.06
TE M对于深部低阻层的分辨能力模拟分析
Resolution capability priliminary analysis of deep conductive layer with TEM method
摘要
Abstract
In order to find out the resolution capability of depth conductive layer for TEM method,series of three-layer H style model was designed,and effect of which 1D inversion was analyzed in the condition of vary model parameters.The param-eters have been concluded on which condition the conductive layer can be recognized or can't be recognized.The calculation re-sult shows that only the conductive layer with enough difference with country layer and with enough thickness can be recognized in 1D inversion result reliably.The critical parameters to separate the reliable resolution and unreliable resolution out are of-fered,which may has practical significance of the awareness of field measurement data inversion results.关键词
瞬变电磁/一维反演/深部/分辨力Key words
TEM/1D inversion/deep level/resolution capability分类
天文与地球科学引用本文复制引用
武军杰,杨毅,张杰,王兴春,邓晓红,吕国印..TE M对于深部低阻层的分辨能力模拟分析[J].物探化探计算技术,2014,(5):547-554,8.基金项目
公益性行业科研专项（200911017）；老矿山深部和外围找矿（12120113085800）；物化探研究所中央级公益性科研院所基本科研业务费专项资金 （）
