无线电通信技术Issue(4)：73-76,4.
Virtex FP GA抗单粒子翻转技术
Technique of Single Event Upset for Virtex FPGA
高鹏 1庞宗强 1周同1
作者信息
- 1. 中国电子科技集团公司第五十四研究所，河北 石家庄050081
- 折叠
摘要
Abstract
The development process of SRAM-based FPGA is various,and it is widely applied to astronautics. The SRAM FPGA are sensitive to single event upset ( SEU) which might result in information loss or functional interruption. The adverse effects caused by SEU can be effectively controlled by Triple Modular Redundancy ( TMR) and scrubbing. The TMR and scrubbing are discussed in detail. The solution of self-hosting configuration management and TMR is proposed. The efficient use of resources is improved based on self-hosting configuration management of FPGA,and the fault injection test result shows that this solution is feasible.关键词
单粒子翻转/三模冗余/自主刷新Key words
single event upset/triple modular redundancy/self-hosting configuration management分类
信息技术与安全科学引用本文复制引用
高鹏,庞宗强,周同..Virtex FP GA抗单粒子翻转技术[J].无线电通信技术,2014,(4):73-76,4.
