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系统集成中的高阻硅IPD技术

刘勇

现代电子技术Issue(14):128-131,4.
现代电子技术Issue(14):128-131,4.

系统集成中的高阻硅IPD技术

High resistance silicon integrated passive device technology for system integration

刘勇1

作者信息

  • 1. 中国电子科技集团公司 第三十八研究所,安徽 合肥 230088
  • 折叠

摘要

Abstract

Integrated passive device(IPD)technology can integrate discrete passive devices into a substrate,and improve the Q factor and system integration level. The inductor whose Q factor is up to 70 can be prepared by high resistance silicon IPD (HRS-IPD) technology because the HRS substrate has a good RF property. HRS-IPD based on thin film technology has the characteristics of high precision and high integration;meanwhile,by which the feature size can be reduced by one order of mag-nitude. Batch fabrication with lower cost can be realized with the mature silicon technology. Furthermore,HRS-IPD technology can be combined with through silicon via(TSV)technology to realize 3D system packaging. The analyses indicate that the HRS-IPD technology has a good application prospect in system integration.

关键词

IPD/系统集成/高阻硅/无源器件/滤波器

Key words

IPD/system integration/high resistance silicon/passive device/filter

分类

信息技术与安全科学

引用本文复制引用

刘勇..系统集成中的高阻硅IPD技术[J].现代电子技术,2014,(14):128-131,4.

基金项目

国防预研资助项目;国家自然科学基金资助项目 ()

现代电子技术

OA北大核心CSTPCD

1004-373X

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