太赫兹科学与电子信息学报Issue(2)：352-357,6.DOI:10.11805/TKYDA201502.0352
基于FPGA嵌入式的SRAM测试方法
A novel SRAM test method based on embedded implementation on FPGA
张京晶 1陈佳 2万旻1
作者信息
- 1. 北京空间机电研究所，北京 100094
- 2. 中国通信卫星事业部，北京 100094
- 折叠
摘要
Abstract
With the development of satellite based remote sensors, embedded systems become more and more popular in space camera electronics. Static Random Access Memory(SRAM) is one kind of the most widely used memories due to its merits of high efficiency and low power dissipation, but testing its function still depends on writing testing modules with hardware description language, which results in low developing efficiency and low reliability. In this paper, an embedded testing method is proposed, which is based on MicroBlaze and its speed increasing function design. Implementation of the test method is based on reusable Intellectual Property(IP) technique and greatly improves data transfer speed. With this method, secondary development of SRAM test system can be made in application layer instead of fundamental logical layer, which simplifies the system design. It is not only more efficient and more reliable, but also easier to transplant, which greatly reduces test design cost. The validity and feasibility of the method have been proved by test results.关键词
静态随机存储器/现场可编程门阵列/嵌入式/可靠性/高速电路Key words
Static Random Access Memory/Field Programmable Gate Array/embedded system/reliability/high-speed circuits分类
信息技术与安全科学引用本文复制引用
张京晶,陈佳,万旻..基于FPGA嵌入式的SRAM测试方法[J].太赫兹科学与电子信息学报,2015,(2):352-357,6.
