液晶与显示Issue(6)：1077-1082,6.DOI:10.3788/YJYXS20142906.1077
Tips-PEN 薄膜载流子迁移率的稳态 SCLC 与阻抗谱法测量的研究
Tips-PEN thin film carrier mobility evaluated by steady-state SCLC and impedance spectroscopy
摘要
Abstract
The field-dependent hole mobility of Tips-PEN film prepared by solution-process was ex-tracted with steady-state SCLC and impedance spectroscopy method,and the results of the two methods were compared and analyzed.The samples used in this study have a general structure of p+Si/PEDOT∶PSS/Tips-PEN/Ag,which is a single-carrier device.For Tips-PEN thickness of 87 nm devices,the zero field mobility and the field-dependent factors obtained with steady-state SCLC were 1.21 × 10 -5 cm2/(Vs)and 0.002 4 (cm/V)1/2 ,respectively.For thickness of 827 nm device,the zero field mobility and field-dependent factors obtained with impedance spectroscopy were 1.21 9 × 10 -5 cm2/(Vs)and 0.003 47 (cm/V)1/2 ,respectively.The smaller field-dependent factor obtained by steady-state SCLC shows that the mobility is weaker dependent on the field.This is due to much higher electric field applied in order to get steady-state free-trap SCLC than that in impedance spec-troscopy and then higher carrier concentration is injected.The result shows that there is weaker elec-tric field dependence of mobility in higher carrier concentration and is consistent with theoretical model and simulation.关键词
Tips-Pentacene/空间电荷限制电流/阻抗谱/迁移率Key words
Tips-Pentacene/space charge limited current/impedance spectroscopy/mobility分类
信息技术与安全科学引用本文复制引用
景亚霓,滕支刚,魏志芬..Tips-PEN 薄膜载流子迁移率的稳态 SCLC 与阻抗谱法测量的研究[J].液晶与显示,2014,(6):1077-1082,6.基金项目
国家自然科学基金项目(No．60776056) （No．60776056）
