| 注册
首页|期刊导航|原子能科学技术|X 射线测厚仪刻度校正模型的研究

X 射线测厚仪刻度校正模型的研究

徐广铎 王立强 童建民

原子能科学技术Issue(5):925-929,5.
原子能科学技术Issue(5):925-929,5.DOI:10.7538/yzk.2014.48.05.0925

X 射线测厚仪刻度校正模型的研究

Research on Calibration Model of X-ray Thickness Gauge

徐广铎 1王立强 1童建民1

作者信息

  • 1. 清华大学 核能与新能源技术研究院,北京 102201
  • 折叠

摘要

Abstract

A new model w hich describes the attenuation of X-ray in the X-ray thickness gauge was proposed .Based on measured data of several calibration plates whose thick-ness is already known ,this model was compared with other gauging models mentioned in other papers according to different numbers of data points ,different data point distri-butions and other situations . The calculated values with the new model are in good agreement with experimental data .When the number of data points decreases and the distribution of data points changes ,the new model maintains a hign accuracy and pres-ents a better numerical stability than other models .

关键词

X射线/测厚仪/刻度校正/衰减模型

Key words

X-ray/thickness gauge/calibration/attenuation model

分类

能源科技

引用本文复制引用

徐广铎,王立强,童建民..X 射线测厚仪刻度校正模型的研究[J].原子能科学技术,2014,(5):925-929,5.

原子能科学技术

OA北大核心CSCDCSTPCD

1000-6931

访问量0
|
下载量0
段落导航相关论文