原子能科学技术Issue(3)：534-539,6.DOI:10.7538/yzk.2015.49.03.0534
高分辨率X射线探测器读出电子学系统的研制及性能测试
Development and Performance Evaluation of Read-out Electronics System for High Resolution X-ray Detector
摘要
Abstract
An electronics system was developed according to the low noise requirement of FOT X‐ray detector in this paper .The electronics system consists of an analog drive circuit ,a front end processing circuit and a digital signal processing circuit w hich is based on field programmable gate array (FPGA ) . The performance of FOT X‐ray detector was evaluated on the X‐ray imaging platform . The overall system gain is 0.168 6 DN/e- ,and the linear operating range of the detector is 0‐154 μGy .When the cooling temperature reaches -20 ℃ ,the dark current noise is 0.037 e- /(pixel · s) and the read noise is 10.9 e- .The intrinsic spatial resolution of the detector is 16 lp/mm . The results indicate that the designed read‐out electronics system meets the require‐ments of high resolution X‐ray detector .关键词
X射线探测器/读出电子学/现场可编程门阵列Key words
X-ray detector/read-out electronics/FPGA分类
能源科技引用本文复制引用
张红凯,冯召东,李晓辉,杜秋宇,魏书军,刘双全,秦秀波,魏存峰,魏龙..高分辨率X射线探测器读出电子学系统的研制及性能测试[J].原子能科学技术,2015,(3):534-539,6.基金项目
国家重大科学仪器设备开发专项资助（2011YQ03011205，2013YQ03062902）；国家自然科学基金大装置联合基金重点资助项目 （）
