中国舰船研究Issue(2)：65-69,5.DOI:10.3969/j.issn.1673-3185.2015.02.012
PIN二极管限幅器的电磁脉冲损伤特性试验
Experimental investigation on the EMP damage characteristics of PIN diode limiters
摘要
Abstract
Limiters at the front-end of the RF device plays the role protecting the receivers from EMP radi⁃ation. In this paper,experimental research is conducted on the damage threshold and damage effects of typi⁃cal limiters based on multistage PIN diodes,and it is discovered that the limiter will suffer irreversible and accumulated damage if square pulses and ultra-wide band pulses are injected into the limiters. After the limiter is damaged,Time Domaln Reflection(TDR)method is utilized to locate the invalid device inside the limiter,and it is noted that the posterior-stage PIN diodes are more vulnerable to high-voltage inci⁃dent pulses in comparison with the anterior-stage diodes. The reason behind is that the the intrinsic layers of the anterior-stage diodes are thicker than those of the posterior-stage ones,which leads to relatively long response time when pulses with sharp rising edge are injected,and,therefore,the amplitude of the spike leakage voltage is relatively large. Then,the leaked spikes may induce electrical stress on the poste⁃rior-stage diodes with thinner intrinsic layers and finally result in irreversible damage.关键词
PIN二极管/限幅器/电磁脉冲/损伤特性Key words
PIN diode/limiter/electromagnetic pulse(EMP)/damage characteristics分类
交通工程引用本文复制引用
王冬冬,邓峰,郑生全,侯冬云..PIN二极管限幅器的电磁脉冲损伤特性试验[J].中国舰船研究,2015,(2):65-69,5.基金项目
国家级重大基础研究项目 （）
