首页|期刊导航|半导体学报(英文版)|Correlation between the structural, morphological, optical, and electrical properties of In2O3 thin films obtained by an ultrasonic spray CVD process

Correlation between the structural, morphological, optical, and electrical properties of In2O3 thin films obtained by an ultrasonic spray CVD processOACSCDCSTPCD

Correlation between the structural, morphological, optical, and electrical properties of In2O3 thin films obtained by an ultrasonic spray CVD process

A.Bouhdjer;A.Attaf;H.Saidi;H.Bendjedidi;Y.Benkhetta;I.Bouhaf

Laboratory of Semiconductors Materials, University of Med Kheider, BP 145 RP, 07000 Biskra, AlgeriaLaboratory of Semiconductors Materials, University of Med Kheider, BP 145 RP, 07000 Biskra, AlgeriaLaboratory of Semiconductors Materials, University of Med Kheider, BP 145 RP, 07000 Biskra, AlgeriaLaboratory of Semiconductors Materials, University of Med Kheider, BP 145 RP, 07000 Biskra, AlgeriaLaboratory of Semiconductors Materials, University of Med Kheider, BP 145 RP, 07000 Biskra, AlgeriaLaboratory of Semiconductors Materials, University of Med Kheider, BP 145 RP, 07000 Biskra, Algeria

indium oxidedeposition timeultrasonic sprayoptical and electrical properties

indium oxidedeposition timeultrasonic sprayoptical and electrical properties

《半导体学报(英文版)》 2015 (8)

9-14,6

10.1088/1674-4926/36/8/082002

评论

您当前未登录!去登录点击加载更多...