半导体学报（英文版）2015，Vol.36Issue(11)：1-14,14.DOI:10.1088/1674-4926/36/11/111001
Single event soft error in advanced integrated circuit
Single event soft error in advanced integrated circuit
Zhao Yuanfu 1Yue Suge 2Zhao Xinyuan 3Lu Shijin 1Bian Qiang 1Wang Liang 1Sun Yongshu1
作者信息
- 1. Beijing Microelectronics Technology Institute, Beijing 100076, China
- 2. Beijing Microelectronics Technology Institute, Beijing 100076, China
- 3. Beijing University of Aeronautics & Astronautics, Beijing 100191, China
- 折叠
摘要
关键词
SET/SEU/MCU/advanced technologyKey words
SET/SEU/MCU/advanced technology引用本文复制引用
Zhao Yuanfu,Yue Suge,Zhao Xinyuan,Lu Shijin,Bian Qiang,Wang Liang,Sun Yongshu..Single event soft error in advanced integrated circuit[J].半导体学报（英文版）,2015,36(11):1-14,14.
