Experimental research on transient radiation effects in microprocessors based on SPARC-V8 architectureOACSCDCSTPCD

作者：Zhao Yuanfu;Zheng Hongchao;Fan Long;Yue Suge;Chen Maoxin;Du Shougang

作者单位：Beijing Microelectronics Technology Institute, Beijing 100076, ChinaBeijing Microelectronics Technology Institute, Beijing 100076, ChinaBeijing Microelectronics Technology Institute, Beijing 100076, ChinaBeijing Microelectronics Technology Institute, Beijing 100076, China Beijing University of Aeronautics & Astronautics, Beijing 100191, ChinaBeijing Microelectronics Technology Institute, Beijing 100076, China

中文关键词：microprocessortransient dose rate effecttransient radiation effect

英文关键词：microprocessortransient dose rate effecttransient radiation effect

刊名：《半导体学报（英文版）》 2015 (11)

页码/页数：58-62,5

DOI：10.1088/1674-4926/36/11/114008