半导体学报（英文版）2015，Vol.36Issue(11)：58-62,5.DOI:10.1088/1674-4926/36/11/114008
Experimental research on transient radiation effects in microprocessors based on SPARC-V8 architecture
Experimental research on transient radiation effects in microprocessors based on SPARC-V8 architecture
Zhao Yuanfu 1Zheng Hongchao 1Fan Long 1Yue Suge 2Chen Maoxin 3Du Shougang1
作者信息
- 1. Beijing Microelectronics Technology Institute, Beijing 100076, China
- 2. Beijing Microelectronics Technology Institute, Beijing 100076, China
- 3. Beijing University of Aeronautics & Astronautics, Beijing 100191, China
- 折叠
摘要
关键词
microprocessor/transient dose rate effect/transient radiation effectKey words
microprocessor/transient dose rate effect/transient radiation effect引用本文复制引用
Zhao Yuanfu,Zheng Hongchao,Fan Long,Yue Suge,Chen Maoxin,Du Shougang..Experimental research on transient radiation effects in microprocessors based on SPARC-V8 architecture[J].半导体学报（英文版）,2015,36(11):58-62,5.
