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Experimental study on the single event effects in pulse width modulators by laser testing

Zhao Wen Guo Xiaoqiang Chen Wei Guo Hongxia Lin Dongsheng Wang Hanning Luo Yinhong

半导体学报（英文版）2015，Vol.36Issue(11)：103-107,5.

半导体学报（英文版）2015，Vol.36Issue(11)：103-107,5.DOI:10.1088/1674-4926/36/11/115008

Experimental study on the single event effects in pulse width modulators by laser testing

Zhao Wen ¹Guo Xiaoqiang ¹Chen Wei ¹Guo Hongxia ¹Lin Dongsheng ¹Wang Hanning ²Luo Yinhong¹

作者信息

1. State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology,Xi'an 710024, China
2. Beijing Microelectronics Technology Institute, Beijing 100076, China
折叠

摘要

关键词

laser simulation/pulse width modulator/single event effect

Key words

laser simulation/pulse width modulator/single event effect

引用本文复制引用

Zhao Wen,Guo Xiaoqiang,Chen Wei,Guo Hongxia,Lin Dongsheng,Wang Hanning,Luo Yinhong..Experimental study on the single event effects in pulse width modulators by laser testing[J].半导体学报（英文版）,2015,36(11):103-107,5.

基金项目

The Authors would like to thank the Innovative & Superior Technology Company for their analysis of UC1845AJ. （）

半导体学报（英文版）

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ISSN：1674-4926

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