单片机与嵌入式系统应用Issue(10)：16-18,26,4.
μC／OS III的中断响应时间分析测量与改善
Interrupt Response Time Analysis and Improvement of μC/OS-III
吕海涛 1朱岩1
作者信息
- 1. 南京理工大学自动化学院，南京210094
- 折叠
摘要
Abstract
In a specific platform ,the interrupt response time of μC/OS‐III is measured and the critical region effect on interrupt response time is analyzed .Finally ,the method of improving the real‐time property of μC/OS‐III is proposed .The experiment results show that the interrupt response time of μC/OS‐III can be controlled under 4 μs .关键词
嵌入式操作系统/LPC1768/中断响应时间/临界区/μC/OS IIIKey words
embedded operating system/LPC1788/interrupt response time/critical region/μC/OS-III分类
计算机与自动化引用本文复制引用
吕海涛,朱岩..μC／OS III的中断响应时间分析测量与改善[J].单片机与嵌入式系统应用,2015,(10):16-18,26,4.
