四川大学学报（自然科学版）Issue(4)：797-801,5.DOI:10.3969/j.issn.0490-6756.2013.04.025
EPBS对氚化钛薄膜中氚量及分布的初步分析
Preliminary analysis on tritium content and depth profile of the titanium films with EPBS method
摘要
Abstract
In recent years ,we tried to develop the b-decay induced X-ray spectroscopy (BIXS) into a rou-tine and accurate tritium analysis method for tritium-containing thin films .Most recently ,the BIXS method ,in which the Monte Carlo simulations and the Tikhonov regularization were used ,was applied to analyze the total tritium content and the tritium depth profile in a series of tritium-containing Ti film samples .As a fast and non-destructive method to analyze the content and depth distribution of the impu-rity elements in film samples ,enhanced proton backscattering spectroscopy (EPBS) ,was employed to compare the results with those of BIXS .Some issues during the analysis were also discussed in this pa-per .关键词
氚分析/BIXS方法/EPBS方法Key words
tritium analysis/BIXS/EPBS分类
能源科技引用本文复制引用
邬琦琦,龙兴贵,毛莉,孙洪伟,安竹..EPBS对氚化钛薄膜中氚量及分布的初步分析[J].四川大学学报（自然科学版）,2013,(4):797-801,5.基金项目
国家自然科学基金 （）
