物理学报Issue(11)：160-166,7.DOI:10.7498/aps.62.110702
石墨烯等二维原子晶体薄片样品的光学衬度计算及其层数表征*
The numerical-aperture-dependent optical contrast and thickness determination of ultrathin flakes of two-dimensional atomic crystals:A case of graphene multilayers*
摘要
Abstract
The optical and electronic properties of two-dimensional atomic crystals including graphene are closely dependent on their layer numbers (or thickness). It is a fundamental issue to fast and accurately identify the layer number of multilayer flakes of two-dimensional atomic crystals before further research and application in optoelectronics. In this paper, we discuss in detail the application of transfer matrix method to simulate the optical contrast of ultrathin flakes of two-dimensional atomic crystals and further to identify their thickness, where numerical aperture of microscope objective is considered. The importance of numerical aperture in the thickness determination is confirmed by the experiments on the graphene flakes. Furthermore, two lasers with different wavelengths can be serviced as light sources for the thickness identification of flakes of two-dimensional atomic crystals with a size close to the diffraction limit of the microscope objective. The transfer matrix method is found to be very useful for the optical-contrast calculation and thickness determination of flakes of two-dimensional atomic crystals on multilayer dielectric substrate.关键词
二维原子晶体材料/层数/传输矩阵/光学衬度Key words
two-dimensional atomic crystals/multilayer/the transfer matrix/optical contrast引用本文复制引用
韩文鹏,史衍猛,李晓莉,罗师强,鲁妍,谭平恒†..石墨烯等二维原子晶体薄片样品的光学衬度计算及其层数表征*[J].物理学报,2013,(11):160-166,7.基金项目
国家自然科学基金(批准号:11175040)资助的课题. （批准号:11175040）
@@@@*Project supported by the National Natural Science Foundation of China (Grant No:11175040) （Grant No:11175040）
