现代电子技术Issue(15)：153-156,4.
智能型并联谐振交直流耐压试验装置的研制
Development of intelligent parallel resonance AC/DC withstand voltage test device
孙冬娥 1郭跃安 1高华 2张莹 1冯亚1
作者信息
- 1. 西北有色地质研究院，陕西 西安 710054
- 2. 西安邮电大学 管理工程学院，陕西 西安 710061
- 折叠
摘要
Abstract
An intelligent AC/DC withstand voltage test device was developed on the basis of parallel resonance compensa⁃tion principle. The device ensures the power frequency and the waveform quality of the test voltage. The real⁃time sampling of state parameters(voltage,current and frequency)for the specimin under test was performed. The intelligent analysis and test result printing for voltage waveform can be conducted according to the experiment request. The detecting precision of the instru⁃ment is 0.5%. The weight of the whole device was lightened from 5~6 t to 50~200 kg. The experiment duration was shortened.关键词
并联谐振技术/工频频率/ADI高性能电能计量芯片/ARM系列芯片Key words
parallel resonance technology/power frequency/high - performance electric energy metrology chip of ADI/ARM series of chip分类
信息技术与安全科学引用本文复制引用
孙冬娥,郭跃安,高华,张莹,冯亚..智能型并联谐振交直流耐压试验装置的研制[J].现代电子技术,2013,(15):153-156,4.
