西安电子科技大学学报（自然科学版）Issue(6)：61-65,87,6.DOI:10.3969/j.issn.1001-2400.2015.06.011
高精度 SARADC 非理想因素分析及校准方法
Analysis of non-ideal factors and digital calibration for highresolution SAR ADCs
摘要
Abstract
An analysis of capacitor mismatch in a high resolution successive approximation register ( SAR) analog‐to‐digital converter ( ADC) is described . The results show that the mismatch of capacitors and the parasitic capacitance in the LSB capacitor array have a significant influence on the resolution of ADC while the parasitic one in MSB array has little influence on the precision . A 16‐bit SAR ADC high‐level model is designed and a background digital calibration is proposed to calibrate the errors due to the mentioned sources . Simulation results indicate that the ENOB( Effective number of bits) after calibration is above 15 bit with a probability of more than 90% . The availability of this calibration method is verified , so it can be utilized to calibrate high‐resolution SAR ADC .关键词
高精度模数转换器/逐次逼近型模数转换器/电容失配/数字校准/高层次建模Key words
high resolution analog-to-digital converters/successive approximation register analog-to-digital converters/capacitor mismatch/digital calibration/high-level model分类
信息技术与安全科学引用本文复制引用
曹超,马瑞,朱樟明,梁宇华,叶谦..高精度 SARADC 非理想因素分析及校准方法[J].西安电子科技大学学报（自然科学版）,2015,(6):61-65,87,6.基金项目
国家自然科学基金资助项目 （）
