原子能科学技术2015，Vol.49Issue(12)：2266-2271,6.DOI:10.7538/yzk.2015.49.12.2266
Flash型FPGA的单粒子效应测试系统研制
Development of Single-event Effect Test System for Flash-based FPGA
王忠明 1闫逸华 1陈荣梅 1王园明 1赵雯 1张凤祁 1郭晓强 1郭红霞1
作者信息
- 1. 西北核技术研究所强脉冲辐射环境模拟与效应国家重点实验室,陕西西安 710024
- 折叠
摘要
Abstract
A single-event effect test system for Flash-based FPGA was developed .The system can be used for SRAM/Flash ROM single-event upset effect test ,D-flip flop single-event effect test ,PLL and clock network single-event transient effect test ,and single-event transient pulse width test .The test methods and hardware/software solu-tions were described in this paper .关键词
单粒子效应/Flash型FPGA/单粒子瞬态Key words
single-event effect/Flash-based FPGA/single-event transient分类
信息技术与安全科学引用本文复制引用
王忠明,闫逸华,陈荣梅,王园明,赵雯,张凤祁,郭晓强,郭红霞..Flash型FPGA的单粒子效应测试系统研制[J].原子能科学技术,2015,49(12):2266-2271,6.
