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首页|期刊导航|半导体学报(英文版)|A threshold-voltage model for small-scaled GaAs nMOSFET with stacked high-k gate dielectric

A threshold-voltage model for small-scaled GaAs nMOSFET with stacked high-k gate dielectric

Liu Chaowen Xu Jingping Liu Lu Lu Hanhan Huang Yuan

半导体学报(英文版)2016,Vol.37Issue(2):71-76,6.
半导体学报(英文版)2016,Vol.37Issue(2):71-76,6.DOI:10.1088/1674-4926/37/2/024004

A threshold-voltage model for small-scaled GaAs nMOSFET with stacked high-k gate dielectric

A threshold-voltage model for small-scaled GaAs nMOSFET with stacked high-k gate dielectric

Liu Chaowen 1Xu Jingping 1Liu Lu 1Lu Hanhan 1Huang Yuan1

作者信息

  • 1. School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan 430074, China
  • 折叠

摘要

关键词

GaAs MOSFET/threshold voltage/stack high-k gate dielectric/quantum effect

Key words

GaAs MOSFET/threshold voltage/stack high-k gate dielectric/quantum effect

引用本文复制引用

Liu Chaowen,Xu Jingping,Liu Lu,Lu Hanhan,Huang Yuan..A threshold-voltage model for small-scaled GaAs nMOSFET with stacked high-k gate dielectric[J].半导体学报(英文版),2016,37(2):71-76,6.

基金项目

Project supported by the National Natural Science Foundation of China (No.61176100). (No.61176100)

半导体学报(英文版)

OACSCDCSTPCDEI

1674-4926

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