电子器件Issue(1)：90-93,4.DOI:10.3969/j.issn.1005-9490.2016.01.019
LTE-A手机接口电平自适应测试电路的设计与研究
Research and Design of Interface Level Adaptive Test Circuit on LTE-A Mobile Phone
摘要
Abstract
Different test board need be used,which Long Term Evolution Advanced(LTE-A)mobile phone of differ⁃ent interface level debugging. Interface level adaptive test circuit scheme based on discrete device is proposed ,auto⁃matically converting the TTL level of CPU UART to 1.8V level,then connected to PC USB interface by TLL to USB level shift IC,which be satisfied for LTE-A mobile phone of different interface level. And only one test circuit board can be used,software development and debug may be accomplished. Then system test are performed.关键词
LTE-A手机/测试电路/接口电平/分立器件Key words
LTE-A mobile hone/test circuit/interface level/discrete device分类
信息技术与安全科学引用本文复制引用
黄学达,毛翔宇..LTE-A手机接口电平自适应测试电路的设计与研究[J].电子器件,2016,(1):90-93,4.基金项目
重庆市科委项目 （）
