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不同生长条件对 Sn 掺杂 ZnO 薄膜电学性能的影响

龚丽 刘云珍 吕建国 叶志镇

长沙理工大学学报(自然科学版)2016,Vol.13Issue(1):81-86,6.
长沙理工大学学报(自然科学版)2016,Vol.13Issue(1):81-86,6.

不同生长条件对 Sn 掺杂 ZnO 薄膜电学性能的影响

Effect of different growth conditions on the electrical properties of Sn doped ZnO thin films

龚丽 1刘云珍 1吕建国 2叶志镇2

作者信息

  • 1. 长沙理工大学 物理与电子科学学院,湖南 长沙 410004
  • 2. 浙江大学 材料科学与工程学院,浙江 杭州 310027
  • 折叠

摘要

Abstract

Sn doped ZnO transparent conductive thin films were prepared on glass substrates by direct reactive magnetron sputtering.The electrical properties of thin films were charac-terized by Hall effect measurement.The effect of different conditions on the electrical prop-erties of thin films was studied.The resistivity decreases and then increases as the Ar/O 2 increases.When the Ar/O 2 is 6,the film has the lowest resistivity of 2.02 × 10 -2 Ω·cm. The resistivity dramatically decreases with the increase of sputtering power,which is the lowest,2.89×10 -2 Ω·cm at 140 W.The lowest resistivity of thin films is 1.45×10 -2 Ω· cm when the sputtering time is 1 1 min.The resistivity of thin films first dramatically de-creases and then increases as the sputtering pressure increases.When the sputtering pres-sure is 0.8 Pa,the lowest resistivity of thin films is 2.17×10 -2 Ω·cm.When the substrate temperature is 475 ℃,the thin films exhibits the best electrical properties,with the lowest resistivity of 2.26×10 -2 Ω·cm.During the whole experiments,the thin film has the best conductivity and the resistivity is 1.45 × 10 -2 Ω· cm,when the ratio of Ar/O 2 is 8,the sputtering power is 180 W,the substrate temperature is 450 ℃,the sputtering pressure is 0.5 Pa,and the sputtering time is 1 1 min.

关键词

ZnO/Sn 掺杂/透明导电薄膜/电学性能/磁控溅射

Key words

ZnO/Sn doping/transparent conductive thin films/electrical property/magne-tron sputtering

分类

数理科学

引用本文复制引用

龚丽,刘云珍,吕建国,叶志镇..不同生长条件对 Sn 掺杂 ZnO 薄膜电学性能的影响[J].长沙理工大学学报(自然科学版),2016,13(1):81-86,6.

基金项目

国家自然科学基金资助项目(51302021) (51302021)

湖南省教育厅科研基金项目(13C1025) (13C1025)

长沙理工大学学报(自然科学版)

OACSTPCD

1672-9331

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