电子科技大学学报2016，Vol.45Issue(2)：316-320,5.DOI:10.3969/j.issn.1001-0548.2016.03.027
双应力同步步降加速寿命试验方法
Double Synchronous-Step-Down-Stress Accelerated Life Testing Method
摘要
Abstract
Reliability evaluation for products of high-reliability and long-lifetime is one of the challenges in reliability engineering. A method of double synchronous-step-down-stress accelerated life testing (DSSDS-ALT) is proposed by considering the long testing time and low efficiency of the double cross-step-down-stress accelerated life testing (DCSDS-ALT). The method uses the drop way of synchronous-step-down for two accelerated stress to form a sloping down trajectory, so it can improve the test efficiency and the whole test state. Numerical simulation was made for the DSSDS-ALT with Monte Carlo method for products whose lifetime follows Weibull distribution. The results indicate that DSSDS-ALT can save testing time and improve efficiency of the test.关键词
加速寿命试验/交叉步降/Monte Carlo/同步步降/Weibull分布Key words
accelerated life test/cross-step-down/Monte Carlo/synchronous-step-down/Weibull distribution分类
信息技术与安全科学引用本文复制引用
寇海霞,安宗文,刘波..双应力同步步降加速寿命试验方法[J].电子科技大学学报,2016,45(2):316-320,5.基金项目
国家自然科学基金(51265025) （51265025）
