舰船电子工程2016，Vol.36Issue(3)：112-114,142,4.DOI:10.3969/j.issn.1672-9730.2016.03.029
基于小波概率神经网络的CMOS 电路 IDDT 诊断方法
IDDT Diagnosis Method of CMOS Circuit Based on Wavelet Probabilistic Neural Network
熊波 1潘强1
作者信息
- 1. 海军工程大学电子工程学院 武汉 430033
- 折叠
摘要
Abstract
In recent years ,IDDT is widely used in studying the fault of CMOS circuit .Combined with wavelet trans-form and probabilistic neural network ,an IDDT diagnosis method based on wavelet analysis and neural network is proposed . With the characteristic of time and frequency localization ,wavelet analysis can effectively extract the characteristic of muta-tion signal ,and makes probabilistic neural network training easier ,possesses fast convergence speed and good classification results ,and can realize any nonlinear approximation .Combine with the advantages of wavelet transform and neural network , the fault diagnosis of CMOS circuit is realized with more than 90% accuracy .关键词
IDDT/小波分析/概率神经网络/CMOS 电路Key words
IDDT/wavelet analysis/probabilistic neural network/CMOS circuit分类
计算机与自动化引用本文复制引用
熊波,潘强..基于小波概率神经网络的CMOS 电路 IDDT 诊断方法[J].舰船电子工程,2016,36(3):112-114,142,4.
