现代电子技术2016，Vol.39Issue(11)：108-112,5.DOI:10.16652/j.issn.1004-373x.2016.11.026
基于NDIR的塑料薄膜厚度在线检测系统
NDIR based on-line detecting system of plastic thin-film thickness
摘要
Abstract
In order to rapidly and accurately measure the plastic thin⁃film thickness on line,a NDIR⁃based on⁃line detec⁃ting technology of infrared thin⁃film thickness is proposed. This technology improved the double and monochromatic infrared light contrastive method common used in modern infrared thickness detecting method,simplified the modulation difficulty of dou⁃ble light sources by means of single light source,and optimized the accuracy problem coming from different film positions radia⁃ted by the double light sources. The detecting system was designed and realized with the above technology. The NDIR correlation technology is used in this system to apply the advanced digital signal processing method to data processing. The detecting results were obtained by the experiment,and then conducted with data analysis and error statistics. The experimental results show this system has the advantages of high accuracy and high stability,and is worthy to generalize.关键词
塑料薄膜/厚度检测技术/红外测厚方法/NDIR/在线测量Key words
plastic thin-film/thickness detecting technology/infrared thickness measuring method/NDIR/on-line mea-surement分类
信息技术与安全科学引用本文复制引用
高振斌,苗永昌,赵洋..基于NDIR的塑料薄膜厚度在线检测系统[J].现代电子技术,2016,39(11):108-112,5.基金项目
国家科技型中小企业技术创新基金项目 （）
