作物学报2016，Vol.42Issue(6)：820-831,12.DOI:10.3724/SP.J.1006.2016.00820
利用高密度SNP遗传图谱定位小麦穗部性状基因
Mapping QTLs For Wheat Panicle Traits with High Density SNP Genetic Map
摘要
Abstract
Panicle traits of wheat are closely correlated between each other, of them grain number per spike and 1000-grain weight are important components of grain yield. In this study, we mapped quantitative trait loci (QTLs) associated with wheat spike traits using a recombinant inbred line (RIL) population (173 lines of F8:9) derived from a cross of Shannong 01-35 × Gaocheng 9411. The phenotypic data were collected in five environments and the high density genetic map was constructed using 90 k SNP array, DArT technology and traditional molecular markers. In a combination analysis of five environments, many additive QTLs were detected including seven for 1000-grain weight, eight for spike length, three for grain number per spike, five for fertile spikelet number per spike, three for sterile spikelet number per spike, four for spikelet number per spike, and six for spike density. Some QTLs showed high rates of phenotypic variation explained (PVE). For example, the PVE of QTLs for 1000-grain weight on 1B, 4B, 5B, and 6A ranged from 6.00%to 36.30%, with the favorable alleles from the large-grain parent Shannong 01-35;the PVE of QTLs for spike length ranged from 14.34%to 25.44%, and that for sterile spikelet number per spike from 8.70%to 37.70%. In addition to additive loci, 32 pairs of epistatic QTLs were detected, which explained 0.05–1.05%of the phenotypic variations. The marker interval between EX_C101685 and RAC875_C27536 on chromosome 4B showed pleiotropic effects in 1000-grain weight, spike length, grain number per spike, fertile spike number, sterile spikelet number, and spikelet number per spike, with the PVE ranging from 5.40% to 37.70%. There stable main QTLs were detected in multiple environments. Besides, marker interval be-tween wPt-0959 and TaGw2-CAPS on 6A had a locus controlling both 1000-grain weight and spikelet number per spike. These results are valuable in developing molecular markers, fine mapping and cloning genes for spike traits in wheat.关键词
普通小麦/90k基因芯片/QTL定位/穗部/SNPKey words
Common wheat/90 k array/QTL mapping/Panicle/SNP引用本文复制引用
刘凯,邓志英,李青芳,张莹,孙彩铃,田纪春,陈建省..利用高密度SNP遗传图谱定位小麦穗部性状基因[J].作物学报,2016,42(6):820-831,12.基金项目
本研究由山东省自然科学基金项目(2015ZRB01179, ZR2013CM004)和山东省种质资源创制课题资助。This study was supported by the Natural Science Foundation of Shandong Province, China (2015ZRB01179 and ZR2013CM004) and the Project of Germplasm Resource Enhancement in Shandong province （2015ZRB01179, ZR2013CM004）
