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Advanced BCD technology with vertical DMOS based on a semi-insulation structure

Ma Kui Fu Xinghua Lin Jiexin Yang Fashun

半导体学报(英文版)2016,Vol.37Issue(7):56-62,7.
半导体学报(英文版)2016,Vol.37Issue(7):56-62,7.DOI:10.1088/1674-4926/37/7/074004

Advanced BCD technology with vertical DMOS based on a semi-insulation structure

Advanced BCD technology with vertical DMOS based on a semi-insulation structure

Ma Kui 1Fu Xinghua 1Lin Jiexin 1Yang Fashun1

作者信息

  • 1. Department of Electronics,Guizhou University,Guiyang 550025,China
  • 折叠

摘要

关键词

semi-insulation structure/vertical DMOS/BCD technology/integrated circuit

Key words

semi-insulation structure/vertical DMOS/BCD technology/integrated circuit

引用本文复制引用

Ma Kui,Fu Xinghua,Lin Jiexin,Yang Fashun..Advanced BCD technology with vertical DMOS based on a semi-insulation structure[J].半导体学报(英文版),2016,37(7):56-62,7.

基金项目

Project supported by the National Natural Science Foundation of China (No.61464002),the Science and Technology Fund of Guizhou Province (No.Qian Ke He J Zi [2014]2066),and the Dr.Fund of Guizhou University (No.Gui Da Ren Ji He Zi (2013)20Hao). (No.61464002)

半导体学报(英文版)

OACSCDCSTPCD

1674-4926

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