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Characteristics of Heat-Annealed Silicon Homojunction Infrared Photodetector Fabricated by Plasma-Assisted Technique

Oday A.HAMMADI

光子传感器(英文版)2016,Vol.6Issue(4):345-350,6.
光子传感器(英文版)2016,Vol.6Issue(4):345-350,6.DOI:10.1007/s13320-016-0338-4

Characteristics of Heat-Annealed Silicon Homojunction Infrared Photodetector Fabricated by Plasma-Assisted Technique

Characteristics of Heat-Annealed Silicon Homojunction Infrared Photodetector Fabricated by Plasma-Assisted Technique

Oday A.HAMMADI1

作者信息

  • 1. Department of Physics,College of Education,Al-Iraqia University,Baghdad,IRAQ
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摘要

关键词

Photodetectors/homojunction/spectral responsivity/plasma-induced etching

Key words

Photodetectors/homojunction/spectral responsivity/plasma-induced etching

引用本文复制引用

Oday A.HAMMADI..Characteristics of Heat-Annealed Silicon Homojunction Infrared Photodetector Fabricated by Plasma-Assisted Technique[J].光子传感器(英文版),2016,6(4):345-350,6.

光子传感器(英文版)

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