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Optical properties of InN studied by spectroscopic ellipsometry

Ye Chunya Lin Wei Zhou Jin Li Shuping Chen Li Li Heng Wu Xiaoxuan

半导体学报（英文版）2016，Vol.37Issue(10)：16-20,5.

半导体学报（英文版）2016，Vol.37Issue(10)：16-20,5.DOI:10.1088/1674-4926/37/10/102002

Optical properties of InN studied by spectroscopic ellipsometry

Ye Chunya ¹Lin Wei ¹Zhou Jin ¹Li Shuping ¹Chen Li ¹Li Heng ¹Wu Xiaoxuan¹

作者信息

1. Fujian Provincial Key Laboratory of Semiconductors and Applications, Collaborative Innovation Center for Optoelectronic Semiconductors and Efficient Devices, Department of Physics, Xiamen University, Xiamen 361005, China
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摘要

关键词

InN/spectroscopic ellipsometry/refractive index/extinction coefficient

Key words

InN/spectroscopic ellipsometry/refractive index/extinction coefficient

引用本文复制引用

Ye Chunya,Lin Wei,Zhou Jin,Li Shuping,Chen Li,Li Heng,Wu Xiaoxuan..Optical properties of InN studied by spectroscopic ellipsometry[J].半导体学报（英文版）,2016,37(10):16-20,5.

基金项目

Project supported by the State Key Development Program for Basic Research of China (No.2012CB619301),the National High Technology Research and Development Program of China (No.2014AA032608),the National Natural Science Foundation of China (Nos.11204254,11404271),and the Fundamental Research Funds for the Central Universities (Nos.2012121014,20720150027). （No.2012CB619301）

半导体学报（英文版）

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ISSN：1674-4926

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