原子能科学技术2016，Vol.50Issue(10)：1909-1914,6.DOI:10.7538/yzk.2016.50.10.1909
中子活化法测量氙在塑料闪烁体表面吸附量的研究
Measurement of Quantity of Xenon Adsorbed on Surface of Plastic Scintillator by Neutron Activation Analysis Method
向永春 1樊铁栓 2张传飞 1罗飞 3王茜 3王红侠 3迮仁德3
作者信息
- 1. 北京大学物理学院，北京 100871
- 2. 中国工程物理研究院核物理与化学研究所，四川绵阳 621900
- 3. 中国工程物理研究院核物理与化学研究所，四川绵阳 621900
- 折叠
摘要
Abstract
The phoswich β‐γ coincident detector is key equipment for weak radioxenon isotope detection .Xenon will be absorbed on the surface of plastic scintillation (BC404) during measurement ,and the absorption will make the detection background increase resulting in severe influences to measurement for next samples of weak‐radioactivity . Neutron activation analysis (NAA) method is popular in trace analysis field because of its high sensitivity and nondestructive characteristic .In this paper ,quantity of absorbed xenon was determined based on MCNP simulation on the γ‐ray peaks of 133 Xe and 135 Xe produced by (n ,2n) reaction . The results show that NAA is a feasible method for measurement xenon absorbed on BC404 surface . The relative standard uncertainty of <br> value is about 22% .Some suggestions for suppressing the standard uncertainty of the data are also proposed according to the source of uncertainty .关键词
氙/中子活化分析法/表面吸附/γ射线Key words
xenon/neutron activation analysis method/surface absorption/γ-ray分类
数理科学引用本文复制引用
向永春,樊铁栓,张传飞,罗飞,王茜,王红侠,迮仁德..中子活化法测量氙在塑料闪烁体表面吸附量的研究[J].原子能科学技术,2016,50(10):1909-1914,6.
