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Mural Defects Detection with Enhanced Terahertz Images

Min-Jie Yuan Wen-Feng Sun Xin-Ke Wang Jia-Sheng Ye Sen Wang Qun-Xi Zhang Yan Zhang

电子科技学刊2016,Vol.14Issue(4):337-342,6.
电子科技学刊2016,Vol.14Issue(4):337-342,6.DOI:10.11989/JEST.1674-862X.608031

Mural Defects Detection with Enhanced Terahertz Images

Mural Defects Detection with Enhanced Terahertz Images

Min-Jie Yuan 1Wen-Feng Sun 1Xin-Ke Wang 1Jia-Sheng Ye 1Sen Wang 2Qun-Xi Zhang 3Yan Zhang1

作者信息

  • 1. Department of Physics, Capital Normal University, Beijing 100048, China
  • 2. Harbin Institute of Technology, Weihai 264209, China.
  • 3. Shaanxi History Museum, Xi'an 710061, China
  • 折叠

摘要

关键词

Comprehensive enhancement algorithm/murals/non-invasive detection/terahertz tomography

Key words

Comprehensive enhancement algorithm/murals/non-invasive detection/terahertz tomography

引用本文复制引用

Min-Jie Yuan,Wen-Feng Sun,Xin-Ke Wang,Jia-Sheng Ye,Sen Wang,Qun-Xi Zhang,Yan Zhang..Mural Defects Detection with Enhanced Terahertz Images[J].电子科技学刊,2016,14(4):337-342,6.

基金项目

This work was supported by the 973 Program of China under Grant No.2013CBA01702,National Natural Science Foundation of China under Grant No.11474206,No.91233202,No.11374216,and No.11404224,Program for New Century Excellent Talents in University under Grant No.NCET-12-0607,Scientific Research Project of Beijing Education Commission under Grant No.KM201310028005,Specialized Research Fund for the Doctoral Program of Higher Education under Grant No.20121108120009,and the Beijing Youth Top-Notch Talent Training Plan under Grant No.CIT&TCD201504080. ()

电子科技学刊

OACSCD

1674-862X

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