半导体学报（英文版）2016，Vol.37Issue(12)：64-69,6.DOI:10.1088/1674-4926/37/12/125001
Efficient SRAM yield optimization with mixture surrogate modeling
Efficient SRAM yield optimization with mixture surrogate modeling
Jiang Zhongjian 1Ye Zuochang 1Wang Yan1
作者信息
- 1. Tsinghua National Laboratory for Information Science and Technology, Institute of Microelectronics, Tsinghua University,Beijing 100084, China
- 折叠
摘要
关键词
yield optimization/ process variations/ design variations/ mixture surrogate model/ statistical analysis/importance samplingKey words
yield optimization/ process variations/ design variations/ mixture surrogate model/ statistical analysis/importance sampling引用本文复制引用
Jiang Zhongjian,Ye Zuochang,Wang Yan..Efficient SRAM yield optimization with mixture surrogate modeling[J].半导体学报（英文版）,2016,37(12):64-69,6.
