电气传动2016，Vol.46Issue(10)：72-75,4.DOI:10.19457/j.1001-2095.20161016
基于加速老化试验的IGBT寿命预测模型研究
Research on IGBT Lifetime Prediction Models Based on Accelerated Lifetime Test
摘要
Abstract
Insulated gate bipolar transistor(IGBT)often works in overheating and large temperature fluctuating conditions,when the heating damage accumulates to a certain degree,the failure of IGBT module is most likely occur, which leads to huge losses in electric system. If we can estimate the life of the module according to lifetime prediction model,the module can be replaced before it is going to fail,so it is possible to avoid losses caused by sudden failure of the module. Therefore,the IGBT temperature cycling test was done and the case temperature was detected simultaneously,then researched the relationship between IGBT lifetime and case temperature which was more accessible. Based on the existing life models,provided an improved lifetime prediction model which is proved having the higher accuracy.关键词
绝缘栅双极型晶体管/温度循环/寿命预测模型Key words
insulated gate bipolar transistor(IGBT)/temperature recycle/lifetime prediction models分类
信息技术与安全科学引用本文复制引用
张亚玲,李志刚..基于加速老化试验的IGBT寿命预测模型研究[J].电气传动,2016,46(10):72-75,4.基金项目
国家科技支撑计划资助项目（2015BAA09B01）；河北省科技支撑计划资助项目 （）
