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6T SRAM cell analysis for DRV and read stability

Ruchi S.Dasgupta

半导体学报(英文版)2017,Vol.38Issue(2):73-79,7.
半导体学报(英文版)2017,Vol.38Issue(2):73-79,7.DOI:10.1088/1674-4926/38/2/025001

6T SRAM cell analysis for DRV and read stability

6T SRAM cell analysis for DRV and read stability

Ruchi 1S.Dasgupta1

作者信息

  • 1. Department of Electronics and Communication Engineering, Indian Institute of Technology, Roorkee, India
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摘要

关键词

DRV/SRRV/WRRV/data retention/leakage reduction/low power SRAM/sensitivity analysis

Key words

DRV/SRRV/WRRV/data retention/leakage reduction/low power SRAM/sensitivity analysis

引用本文复制引用

Ruchi,S.Dasgupta..6T SRAM cell analysis for DRV and read stability[J].半导体学报(英文版),2017,38(2):73-79,7.

半导体学报(英文版)

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1674-4926

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