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小样本数据下功率模块开关损耗模型研究∗

梅霜 李志刚

电子器件2017,Vol.40Issue(1):228-231,4.
电子器件2017,Vol.40Issue(1):228-231,4.DOI:10.3969/j.issn.1005-9490.2017.01.043

小样本数据下功率模块开关损耗模型研究∗

The Research of Switching Loss in Power Module Under the Small Sample Data

梅霜 1李志刚1

作者信息

  • 1. 河北工业大学电气工程学院,天津300310
  • 折叠

摘要

Abstract

The modeling of switching loss in power modules is important in practice for the prediction and evaluation of new energy system reliability. Using the power modules dynamic test system that can automatically adjust the DC bus voltage、collector current、gate drive voltage and gate resistance. Recording switching dynamic voltage and current waveforms to obtain precise switching loss values by processing. A switching loss model that improved the existing switching loss model based on a small sample of test points was established by SVM algorithm.

关键词

功率模块/开关损耗/SVM/小样本

Key words

power module/switching loss/SVM/small sample

分类

信息技术与安全科学

引用本文复制引用

梅霜,李志刚..小样本数据下功率模块开关损耗模型研究∗[J].电子器件,2017,40(1):228-231,4.

基金项目

国家科技支撑计划项目(2015BAA09B01);国家自然科学基金项目(51377044);河北省科技计划项目(14214503D,13214303D) (2015BAA09B01)

电子器件

OA北大核心CSTPCD

1005-9490

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