高压电器2017，Vol.53Issue(3)：167-171,5.DOI:10.13296/j.1001-1609.hva.2017.03.026
老炼方式对40.5kV真空灭弧室投切背对背电容器组的影响
Effect of Ageing Method on 40.5 kV Vacuum Interrupter for Switching Back-to-back Capacitor Bank
李敏 1王南南1
作者信息
- 1. 天津平高智能电气有限公司,天津300300
- 折叠
摘要
Abstract
To reduce the reignition rate of a vacuum interrupter in switching back to back capacitor bank,the effects of voltage ageing,current ageing and nanosecond pulse ageing on the 40.5 kV vacuum interrupter for switching back-to-back capacitor bank are investigated,hence effect of ageing method on 40.5 kV vacuum interrupter for switching back-to-back capacitor bank is obtained.The contact surface can be aged completely by the nanosecond pulse ageing method,while the contact surface can only be partly aged by the voltage or current ageing method.The vacuum interrupter aged by the nanosecond pulse ageing method can successfully pass the switching test of back-to-back capacitor bank.The vacuum interrupter aged by the current ageing method can pass the switching test of back-to-back capacitor bank for 16 times,then reignition occurs.The vacuum interrupter aged by the voltage ageing method can pass the same test for only once,then reignition occurs 300 ms after the switching.关键词
真空灭弧室/纳秒脉冲老炼/投切/背对背电容器组Key words
vacuum interrupter/nanosecond pulse ageing/switching/back-to-back capacitor bank引用本文复制引用
李敏,王南南..老炼方式对40.5kV真空灭弧室投切背对背电容器组的影响[J].高压电器,2017,53(3):167-171,5.
