计算机工程与应用2017，Vol.53Issue(5)：202-206,254,6.DOI:10.3778/j.issn.1002-8331.1507-0286
基于MapReduce的液晶屏缺陷检测方法
MapReduce approach for defect inspection of TFT-LC D
摘要
Abstract
Various types of defects would come into being in the process of producing 6th TFT-LCD. There are bottlenecks of storing resources and calculating time by inspecting defects with one single machine. It is a new way to deal with mas-sive high-resolution LCD images by Hadoop clusters, which has the advantage in computing and storage capacity. Since the defect is a local feature of high-resolution LCD image, a distributed method of defect inspection based on MapReduce framework is proposed in this paper. To solve the problem of low efficiency of high-resolution image in defect inspection, the approach can be simply described as follows. First, the high-resolution image is split into multiple small splits, which are parallel inspected in the following step. In the final step, the intermediate results are aggregated to obtain the final result. The experimental results show that this approach can inspect defects simultaneously on Hadoop cluster with a good speed up rate.关键词
Hadoop/高分辨率图像/缺陷检测/MapReduceKey words
Hadoop/high-resolution image/defect inspection/MapReduce分类
信息技术与安全科学引用本文复制引用
夏晓云,张仁斌,谢瑞,王聪..基于MapReduce的液晶屏缺陷检测方法[J].计算机工程与应用,2017,53(5):202-206,254,6.基金项目
国家自然科学基金(No.61271121). （No.61271121）
