电子科技大学学报2017，Vol.46Issue(2)：386-391,6.DOI:10.3969/j.issn.1001-0548.2017.02.012
一种模拟电路参数型故障诊断新方法
A Novel Method for Parametric Fault Diagnosis of Analog Circuits
摘要
Abstract
This paper proposes a new model for parametric fault diagnosis in analog circuits, which is one of the most challenging problems in circuits and systems. This new model is based on the eigenvalue and phase difference from the time series of the output voltage of the circuit under test (CUT). The phase deviation information of the circuit is obtained via the sampling voltage time series. The sampling voltage time series is reorganized to be a matrix, and dominant eigenvalue of this matrix is obtained accordingly. Finally, by comparing the phase deviation and the dominant eigenvalue of the CUT with those of the fault free circuit in absolute relative error criteria, fault location and parameter identification can be accomplished. Experimental results show that the proposed method performs well in both fault location and parameter identification with very few access points and relatively low computation cost, moreover, fault location and parameter identification can be realized simultaneously, which makes it an effective and efficient method for fault diagnosis of analog circuits.关键词
模拟电路/故障诊断/参数辨识/参数故障Key words
analog circuits/fault diagnosis/parameter identification/parametric faults分类
信息技术与安全科学引用本文复制引用
周启忠,谢永乐,毕东杰,李西峰..一种模拟电路参数型故障诊断新方法[J].电子科技大学学报,2017,46(2):386-391,6.基金项目
国家重点基础研究发展计划(2014CB744206) （2014CB744206）
国家自然科学基金(61371049) （61371049）
四川省教育厅项目(09ZC081) （09ZC081）
