测试技术学报2017，Vol.31Issue(1)：83-89,7.DOI:10.3969/j.issn.1671-7449.2017.01.014
火炮发射高过载存储测试系统设计
Design of High Overload of Gun Launching Measuring System Based on Memory Test Technology
周瑞卿 1贾云飞 1潘孝斌 1袁景丽1
作者信息
- 1. 南京理工大学机械工程学院,江苏南京210094
- 折叠
摘要
Abstract
For a test system that recycles projectile without damage which experiences high overload inside the barrel,a device based on memory test technology is developed to measure high overload of gun launching.STM32 is the control center of this device,which can condition signal,store data,serial ports communication and so on.One external trigger with multiple internal triggers is used in the software.The test phenomenon of being triggered by mistake is avoided effectively.The acceleration sensor and storage test circuits are separated,that is convenient to remove the sensor.This device can be installed in the end of the projectile,which can measure and record acceleration data in the process of launching projectile.The device is recycled after the experiment.The collected data can be read by the PC and can be displayed by waveform.It will provide important experimental basis for theoretical analysis,parameter settings of recycling projectile without damage.关键词
火炮/存储测试/膛内高过载/IEPE加速度传感器Key words
gun/storage test/high overload inside the barrel/IEPE acceleration sensor分类
信息技术与安全科学引用本文复制引用
周瑞卿,贾云飞,潘孝斌,袁景丽..火炮发射高过载存储测试系统设计[J].测试技术学报,2017,31(1):83-89,7.
