计算机与数字工程2017，Vol.45Issue(3)：579-582,4.DOI:10.3969/j.issn.1672-9722.2017.03.036
边界扫描测试技术在存储器测试中的应用
Application of Boundary Scan Test Technology in Memory Test
杨士宁 1顾颖 1石雪梅 1罗晶1
作者信息
- 1. 航天科工防御技术研究实验中心 北京 100854
- 折叠
摘要
Abstract
Boundary scan test technology is one testing technology based on integrate circuit (IC) measurability design.Electrocircuit system can be tested and diagnosed by analyzing the output signal of the circuit inter testing register.The test-port of functional, inter-connect and interactional effect are provided by boundary scan test technology, so it is convenient to test complex IC.The structure, test-flow, test-port and data/instruction register prescribed by IEEE 1149.1 of the boundary scan test are personated.In the end, one testing project of Xilinx programmable memory, XCF series, based Boundary Scan Test is contrived.关键词
边界扫描测试/存储器测试Key words
boundary scan test/memory test分类
信息技术与安全科学引用本文复制引用
杨士宁,顾颖,石雪梅,罗晶..边界扫描测试技术在存储器测试中的应用[J].计算机与数字工程,2017,45(3):579-582,4.
