太赫兹科学与电子信息学报2017，Vol.15Issue(1)：129-133,5.DOI:10.11805/TKYDA201701.0129
低压差线性稳压器瞬时电离辐射试验方法
Transient ionizing radiation effects for experimental method of LDO
摘要
Abstract
In the nuclear explosion environment,it is required that the output voltage of Low Dropout Regulator(LDO) can recover quickly.The relationship between the output voltage recovery time and the load resistance after the instantaneous ionizing radiation has been qualitatively analyzed.The experimental study is carried out on the effects of instantaneous ionizing radiation based on the "Qiang-guang-I" accelerator.The close relationship is found exiting between the output voltage recovery time and the load resistance by analyzing many experimental results.The recovery time of the circuit can be effectively reduced by adjusting the load resistance value which is tested by the instantaneous ionizing radiation experiment.The test results show that LDO output voltage recovery time decreases to 100 μs after the instantaneous ionizing radiation of 1.0× 1011 rad(Si)/s.关键词
低压差线性稳压器/瞬时电离辐射效应/恢复时间Key words
Low Dropout Regulators/transient ionizing radiation effect/recovery time分类
信息技术与安全科学引用本文复制引用
杨力宏,姚和平,刘智,赵光炜,刘娜,时应璇..低压差线性稳压器瞬时电离辐射试验方法[J].太赫兹科学与电子信息学报,2017,15(1):129-133,5.基金项目
装备预先研究资助项目(51311050301) （51311050301）
