中国空间科学技术2017，Vol.37Issue(2)：17-23,7.DOI:10.16708/j.cnki.1000-758X.2017.0023
一种计算金属二次电子发射系数的解析模型
Analytical model for secondary electron yield of metals
摘要
Abstract
An accurate model for secondary electron yield (SEY) is of great importance for the calculation of multipactor threshold,but the existing SEY model is deficient in satisfying the needs of accuracy and conciseness at the same time.An analytical model for SEY of metals was presented by analyzing the escaping probability of secondary electrons combined with the modified Bethe energy loss equation. Furthermore,SEY models for uncleaned and Ar ion cleaned Ag samples were obtained by fitting the experimental results with the analytical model.Calculation results show that the standard deviation between SEY models and experimental results of uncleaned and Ar ion cleaned Ag is within 4% at different incident angles,which indicates that the analytical model presented can be used to establish the accurate SEY model of metals and calculate multipactor threshold of space high power microwave component and density of electron cloud in accelerator.关键词
二次电子发射/空间大功率微波部件/解析模型/金属表面/能量损失Key words
secondary electron yield/space high power microwave component/analytical model/metal surface/energy loss分类
信息技术与安全科学引用本文复制引用
何鋆,李军,曹猛,崔万照,刘纯亮..一种计算金属二次电子发射系数的解析模型[J].中国空间科学技术,2017,37(2):17-23,7.基金项目
国家自然科学基金(U1537211,11675278,51675421) （U1537211,11675278,51675421）
中国博士后科学基金 (2015M572661XB) （2015M572661XB）
陕西省博士后科研项目 （）
