计量学报2016，Vol.37Issue(z1)：29-33,5.DOI:10.3969/j.issn.1000-1158.2016.z1.07
X射线半值层测量方法研究
Study of X-ray Half-value-layer Measurement Methods
杜海燕 1吴金杰 2廖振宇 2赖万昌 2刘莹 3康佳佳1
作者信息
- 1. 成都理工大学,四川成都610059
- 2. 中国计量科学研究院,北京100029
- 3. 南华大学,湖南衡阳421001
- 折叠
摘要
Abstract
According to ISO 4037,the narrow spectrum series standard radiation are bulid,then the standard radiation is used to study the influence on the narrow and broad beam condition and the detection distance on X-ray half-value-layer measurement.When the energy of X-ray up to some degree,the influence of the scatter cannot be ignored and it needs to measure the X-ray half-value-layer in narrow beam condition.When measure the half-value-layer of the narrow spectrum X-ray that established according to ISO 4037,it should be done the job under the narrow beam condition when the tube voltage higher than 60 kV.When the energy of the beam is higher than 45.8 keV,scattering can not be ignored,the half-value-layer measurement need to be done under the narrow beam condition.When the half-value-layer under the broad beam condition is measured,the influence of the scattering can be reduced according to increase the detection distance in proper range.关键词
计量学/半值层/窄束/宽束/探测距离Key words
metrology/half-value-layer/narrow beam/broad beam/detection distance分类
通用工业技术引用本文复制引用
杜海燕,吴金杰,廖振宇,赖万昌,刘莹,康佳佳..X射线半值层测量方法研究[J].计量学报,2016,37(z1):29-33,5.
