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TFT-LCD边角漏光不良机理分析及改善研究

见帅敏 解洋 夏高飞 孙禄标 孟维欣 申澈 郭建

液晶与显示2017,Vol.32Issue(6):455-460,6.
液晶与显示2017,Vol.32Issue(6):455-460,6.DOI:10.3788/YJYXS20173206.0455

TFT-LCD边角漏光不良机理分析及改善研究

Analysis and improvement of TFT-LCD edge light-leaking mechanism

见帅敏 1解洋 1夏高飞 1孙禄标 1孟维欣 1申澈 1郭建1

作者信息

  • 1. 鄂尔多斯市源盛光电有限责任公司,内蒙古 鄂尔多斯 017000
  • 折叠

摘要

Abstract

At present, Thin Film Transistor Liquid Crystal Display (TFT-LCD, Thin-Film Technology Liquid Crystal Display) has become the mainstream in the field of Display products, and LCD panel is an important component of TFT-LCD.LCD edge light-leaking can cause image distortion, affect the visual effects, resulting in lower quality display screen and yield, thus improving the edge light-leaking become an urgent problem to be solved.This paper studies the influence of the abnormal orientation of liquid crystal and PI film on the edge light-leaking, the influence of LC Pattern design on edge light-leaking, and the influence of the Si-Ball edge light-leaking.The result illustrates the LC Pattern design for edge light-leaking improvement has a good effect, the pattern drawing is more likely to cause LCD puncture phenomenon, the droplet optimization can be relatively better.The effect of small Si-Ball on the edge light-leaking is the best.Meanwhile, we eliminated the smaller silicon ball by reliability verification and found the range of Si-Ball.Excluding small Si-Ball limits the choice of Si-Ball from the reliability of validation and others.

关键词

TFT-LCD/边角漏光/LCPattern/Si-Ball

Key words

TFT-LCD/edge light-leaking/LC pattern/Si-Ball

分类

信息技术与安全科学

引用本文复制引用

见帅敏,解洋,夏高飞,孙禄标,孟维欣,申澈,郭建..TFT-LCD边角漏光不良机理分析及改善研究[J].液晶与显示,2017,32(6):455-460,6.

液晶与显示

OA北大核心CSCDCSTPCD

1007-2780

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