空间电子技术2017，Vol.14Issue(1)：9-14,6.DOI:10.3969/j.issn.1674-7135.2017.01.003
一种评估单粒子效应的XDL网表级电路拓扑关系构建方法
A Method of Constructing Logical Topology in Circuits for Assessing Single Event Effects Based on XDL Netlist
高翔 1周国昌 1赖晓玲 1朱启 1杨玉辰1
作者信息
- 1. 中国空间技术研究院 西安分院,西安 710000
- 折叠
摘要
Abstract
For the effect of signal propagation in the programmable logic device caused by SEE(single event effects) of the space environment,a method of constructing circuit netlist-level signal propagation topology for assessing soft error by SEE is proposed in this paper.This method makes use of the mapping relationship between the synthesized XDL netlist and the device resource.Then the logical topology in circuits is built based on the physical architecture of device sources though the algorithm of depth first search and the matching rules of control configuration bits vulnerable by SEE.So this method could be helpful to analysis the transmission of soft error in circuits caused by SEE.Ultimately,an example of 16 frequency division circuit is used to verify this method effectively that the evaluation of mitigating SEE in circuit system could be improved.关键词
SRAM型FPGA器件/前向电路/电路节点/单粒子软错误/XDL网表Key words
SRAM-based FPGA/Forward circuit/Circuit nodes/Soft error/XDL netlist分类
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高翔,周国昌,赖晓玲,朱启,杨玉辰..一种评估单粒子效应的XDL网表级电路拓扑关系构建方法[J].空间电子技术,2017,14(1):9-14,6.
