现代电子技术2017，Vol.40Issue(5)：58-62,5.DOI:10.16652/j.issn.1004-373x.2017.05.015
基于序贯相似性与光源自动调节的芯片表面缺陷检测算法
An algorithm for chip surface defect detection based on sequential similarity and light source automatic adjustment
摘要
Abstract
Since the current defect detection algorithm used in the protection cover reflective environment is easy to result in the nonuniform illumination of the acquired image of the chip connector,make its defect detection precision low,and is unable to locate the shallow insert and damage,an algorithm for chip connector′s surface defect detection based on the sequential simi-larity detecting marching and light source automatic adjustment was designed. On the basis of the sequential similarity detection matching,the position of the connector is located to extract the often occurring nonuniform illumination area of the connector. The light source automatic adjustment mechanism was designed. The visual software triggers the light source′s turnoff or dim-ming through the light source digital controller SDK and cable to eliminate the effect of light reflected by the protection cover on image quality. The line detection is used to count the features of the binary image of the defect area to detect the defect. The ex-perimental data shows that,in comparison with the current defect detecting technology,the algorithm proposed in this paper has higher detecting precision while detecting the defect of the chip connector in the protection cover reflective environment.关键词
缺陷检测/图像处理/光源自动调节/序贯相似性检测/线检测Key words
defect detection/image processing/light source automatic adjustment/sequential similarity detection/line de-tection分类
信息技术与安全科学引用本文复制引用
冯莉,龚子华..基于序贯相似性与光源自动调节的芯片表面缺陷检测算法[J].现代电子技术,2017,40(5):58-62,5.基金项目
福建省教育厅科研课题资助项目(JAT160832) （JAT160832）
