真空电子技术Issue(1)：58-62,5.
阴极发射不足引发微波管高压击穿现象的研究
Study on High Voltage Breakdown Phenomenon Aroused by Less Cathode Emission in Microwave Tubes
阴生毅 1顾红红 1张永清 1丁耀根 1杜锡九2
作者信息
- 1. 中国科学院电子学研究所高功率微波源与技术重点实验室,北京100190
- 2. 广东中能加速器科技有限公司,广东东莞523808
- 折叠
摘要
Abstract
There has been little description on the mechanism of breakdown aroused by less cathode emission in microwave tubes.Focusing on a high-power klystron,the research includes measuring the cathode work conditions during tube breakdown;calculating the static electric field intensity at breakdown points on cathode surface;finding out the cause for less emission at cathode edge;analyzing the influence on the electric field distribution at the less emission points and discussing the mechanism of the high voltage breakdown caused by less emission at cathode edge.The study shows that both the field enhancement effects at emission points caused by less emission at cathode edge and that caused by cathode edge burrs lead to the high voltage breakdown in microwave tubes.关键词
微波管/阴极/高压击穿/电场强度/场增强效应Key words
Microwave tube/Cathode/High voltage breakdown/Electric field strength/Field enhancement effect分类
数理科学引用本文复制引用
阴生毅,顾红红,张永清,丁耀根,杜锡九..阴极发射不足引发微波管高压击穿现象的研究[J].真空电子技术,2017,(1):58-62,5.
