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Insight into multiple-triggering effect in DTSCRs for ESD protection

Lizhong Zhang Yuan Wang Yize Wang Yandong He

半导体学报（英文版）2017，Vol.38Issue(7)：93-96,4.

半导体学报（英文版）2017，Vol.38Issue(7)：93-96,4.DOI:10.1088/1674-4926/38/7/075001

Lizhong Zhang ¹Yuan Wang ¹Yize Wang ¹Yandong He¹

作者信息

1. Key Laboratory of Microelectronic Devices and Circuits(MoE),Institute of Microelectronics,Peking University,Beijing 100871,China
折叠

electrostatic discharge (ESD)/diode-triggered silicon-controlled rectifier (DTSCR)/double snapback/transmission line pulse (TLP) test

electrostatic discharge (ESD)/diode-triggered silicon-controlled rectifier (DTSCR)/double snapback/transmission line pulse (TLP) test

Lizhong Zhang,Yuan Wang,Yize Wang,Yandong He..Insight into multiple-triggering effect in DTSCRs for ESD protection[J].半导体学报（英文版）,2017,38(7):93-96,4.

Project supported by the Beijing Natural Science Foundation,China (No.4162030). （No.4162030）

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ISSN：1674-4926

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