机械与电子2017，Vol.35Issue(7)：43-46,4.
基于半导体制冷技术的高低温试验箱设计
Design of High-Low Temperature Test Chamber Based on Semiconductor Refrigeration Technology
摘要
Abstract
Based on semiconductor refrigeration technology,a high-low temperature test chamber was designed,which took MC9S12XS128 as the core control chip,semiconductor refrigeration plate as the cooling device,and the silica sheet as the heating device.The accurate temperature measurement was conducted on multi-points of the test chamber through the optimized layout of DS18B20,and the measured temperature information was transmitted to the main control chip for real-time data processing.The temperature range can be set on the upper computer interface,which also shows the current temperature in the box.The experimental results show that the designed high-low temperature test chamber has the advantages of small size,simple structure,high control precision,and good stability.It can meet the rigid requirements of high precision instrumentation sensitivity test for the environment,and can be applied into practical projects.关键词
高低温试验箱/MC9S12XS128/半导体制冷/DS18B20Key words
high-low temperature test chamber/MC9S12XS128/semiconductor refrigeration/DS18B20分类
信息技术与安全科学引用本文复制引用
冯利,秦刚,陈忠孝,高雅,薛绍凡..基于半导体制冷技术的高低温试验箱设计[J].机械与电子,2017,35(7):43-46,4.基金项目
陕西省科学技术研究发展计划项目(2016GY_044) （2016GY_044）
