电子学报2017，Vol.45Issue(8)：1976-1984,9.DOI:10.3969/j.issn.0372-2112.2017.08.024
基于SRAM型FPGA单粒子效应的故障传播模型
SRAM-Based FPGA SEU Fault Propagation Model
摘要
Abstract
SRAM-based FPGA (Field Programmable Gate Array) could be affected by SEU (Single Event Upset) in radiation environment,causing circuit function failures.This paper proposes an SEU-induced fault propagation model for FPGAs based on the graph theory and the cellular automata.In addition,this paper divides SEU effect into two parts: SBU (Single-Bit Upset) and MBU (Multi-Bit Upset) because MBU has an extra problem about conflict management.The core part of this model is the computing method of the coupling degree which is based upon relative bits from FPGA placement and routing results to make the model more accurate.After validation between fault propagation model and fault injection experiment,this fault propagation model is 19.89% more relative to fault injection experiment than the fault propagation model only counting relative bits in LUT (Look Up Table).Finally,this paper analyses an application about this model to find cells most easily leading to fault diffusion.关键词
现场可编程门阵列/单粒子翻转/单位翻转/多位翻转/电路故障传播模型Key words
field programmable gate array (FPGA)/single event upset (SEU)/single-bit upset (SBU)/multi-bit upset (MBU)/fault propagation model分类
信息技术与安全科学引用本文复制引用
吴珊,周学功,王伶俐..基于SRAM型FPGA单粒子效应的故障传播模型[J].电子学报,2017,45(8):1976-1984,9.基金项目
国家自然科学基金(No.61131001) （No.61131001）
