北京师范大学学报（自然科学版）2017，Vol.53Issue(3)：277-280,4.DOI:10.16360/j.cnki.jbnuns.2017.03.006
基于分层法模拟光学薄膜的导纳轨迹图
Admittance locus diagram simulations by stratification
摘要
Abstract
Stratification and transfer matrix methods were used to simulate admittance locus diagrams of optical thin films such as bi-layer antireflection film,three-layer antireflection film and periodic multilayer with high reflection.Characteristics of admittance locus diagrams were analyzed and compared.End point of admittance diagram of an anti-reflective film was found to be close to points in real axis,with a value equal to admittance of incident medium.End point of periodic multilayer was close to zero point or infinite points on real axis.关键词
光学薄膜/导纳轨迹图解/分层法/传输矩阵法Key words
optical thin film/admittance locus diagram/stratification method/transfer matrix method分类
数理科学引用本文复制引用
陈淑静,刘大禾..基于分层法模拟光学薄膜的导纳轨迹图[J].北京师范大学学报（自然科学版）,2017,53(3):277-280,4.基金项目
国家自然科学基金资助项目(11547241) （11547241）
